: Tanaka Nobuo Tanaka
: Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
: World Scientific Publishing Company
: 9781783264711
: 1
: CHF 105.40
:
: Physik, Astronomie
: English
: 616
: DRM
: PC/MAC/eReader/Tablet
: PDF
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.