| Supervisors’ Foreword | 7 |
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| Abstract | 9 |
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| Scientific Output | 10 |
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| Publications | 10 |
| Contributions to Conferences | 11 |
| Contents | 13 |
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| Acronyms | 17 |
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| 1 Introduction | 19 |
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| 1.1 Motivation of the Thesis | 19 |
| 1.2 Current State of Knowledge and Issues Addressed in this Work | 23 |
| 1.2.1 Amorphous Silica | 23 |
| 1.2.2 Magnesium Oxide | 25 |
| 1.3 Description of the Chapters | 26 |
| References | 28 |
| Part I Materials and Methods | 33 |
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| 2 Studied Materials: a-SiO2 and MgO | 34 |
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| 2.1 Amorphous Silica (a-SiO2) | 34 |
| 2.1.1 Structure of Amorphous SiO2 | 34 |
| 2.1.2 Point Defects in Amorphous SiO2 | 36 |
| 2.1.3 Calculation of the OH Concentration in Silica from Infrared Spectroscopic Measurements | 38 |
| 2.2 Magnesium Oxide (MgO) | 41 |
| 2.2.1 Point Defects in MgO | 41 |
| 2.2.2 Impurities in the MgO Samples | 43 |
| References | 44 |
| 3 Ion-Solid Interactions and Ion Beam Modification of Materials | 47 |
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| 3.1 Ion-Solid Interactions | 47 |
| 3.1.1 Stopping Power and Ion Range | 48 |
| 3.1.2 Calculations with SRIM | 54 |
| 3.2 Ion Beam Modification of Materials and Ion Beam Analysis Techniques | 57 |
| 3.2.1 Different Processes of Modification of Materials | 57 |
| 3.2.2 Ion Beam Analysis Techniques | 59 |
| References | 60 |
| 4 Experimental Facilities | 62 |
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| 4.1 Centro de Micro-Análisis de Materiales (CMAM) | 64 |
| 4.2 Centre de Sciences Nucléaires et de Sciences de la Matière (CSNSM) | 66 |
| 4.3 The Ion Beam Materials Laboratory (IBML) | 69 |
| References | 71 |
| 5 Experimental Characterization Techniques | 73 |
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| 5.1 Ion Beam Induced Luminescence (IBIL) | 73 |
| 5.2 Rutherford Backscattering Spectrometry (RBS) | 79 |
| 5.2.1 Description of the RBS Technique | 79 |
| 5.2.2 RBS in Channeling Configuration (RBS/C) | 83 |
| 5.3 X-Ray Diffraction (XRD) | 86 |
| 5.3.1 Crystalline Structures | 86 |
| 5.3.2 Diffraction Phenomenon | 88 |
| 5.3.3 Experimental Setup | 92 |
| References | 95 |
| Part II Ion Beam Induced Luminescence in Amorphous Silica | 97 |
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| 6 General Features of the Ion Beam Induced Luminescence in Amorphous Silica | 98 |
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| 6.1 General Features of the Ionoluminescence Signal in Silica at Room Temperature | 98 |
| 6.2 Ionoluminescence in Silica at Low Temperature | 101 |
| 6.3 Contribution of the Nuclear Stopping Power to the Ionoluminescence Signal | 106 |
| References | 110 |
| 7 Ionoluminescence in Silica: Role of the Silanol Group Content and the Ion Stopping Power | 112 |
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| 7.1 IL Spectra | 113 |
| 7.2 Kinetic Behavior for the IL | 115 |
| 7.3 Dependence of the Maximum Intensity with the Stopping Power | 120 |
| 7.4 Discussion | 122 |
| 7.4.1 Role of the OH Content | 122 |
| 7.4.2 Role of the Electronic Stopping Power | 124 |
| References | 125 |
| 8 Exciton Mechanisms and Modeling of the Ionoluminescence in Silica | 126 |
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| 8.1 Kinetic Behavior for the IL: Correlation with Structural (Macroscopic) Damage | 126 |
| 8.2 Physical Modeling of STE Dynamics and IL Mechanisms | 131 |
| 8.3 Physical Discussion of the Experimental Results: Role of Network Straining | 134 |
| 8.4 Mathematical Formulation of the IL Emission Kinetics: Damage Cross-Sections | 136 |
| References | 138 |
| Part III Ion-Irradiation Damage in MgO | 140 |
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| 9 MgO Under Ion Irradiation at High Temperatures | 141 |
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| 9.1 Full Damage Accumulation Process in MgO Irradiated with MeV Au Ions … | 142 |
| 9.1.1 Disorder Depth Profiles | 143 |
| 9.1.2 Damage Accumulation | 143 |
| 9.1.3 Discussion | 147 |
| 9.2 Study of the Initial Stages of Defect Generation in Ion-Irradiated … | 152 |
| 9.2.1 Strain Evolution | 152 |
| 9.2.2 Defect Concentration | 155 |
| 9.2.3 Defect Generation Efficiency | 158 |
| 9.3 Conclusions | 159 |
| References | 159 |
| 10 Ion Beam Induced Luminescence in MgO | 162 |
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| 10.1 Main Features of the IL Spectrum of MgO | 163 |
| 10.2 Analysis of the IL Spectra of MgO at 100K and at RT with H and Br | 165 |
| 10.3 Kinetics of the Main IL Emissions | 172 |
| 10.4 Discussion | 176 |
| References | 178 |
| 11 Conclusions and Prospects for the Future | 179 |
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| 11.1 Ion Beam Induced Luminescence in Amorphous Silica | 179 |
| 11.2 Ion-Irradiation Damage in MgO | 180 |
| 11.3 Prospects for the Future | 181 |
| References | 182 |
| A Implantation of the Ionoluminescence Technique at the JANNuS-Saclay Laboratory | 183 |
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| Appendix B Example of an Input and an Output File from SRIM | 187 |
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| Appendix C Example of an Input File for TRIM | 189 |
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| Appendix D Example of an Input File for McChasy Code | 190 |