: Raphael Schlesinger
: Energy-Level Control at Hybrid Inorganic/Organic Semiconductor Interfaces
: Springer-Verlag
: 9783319466248
: 1
: CHF 87.30
:
: Theoretische Physik
: English
: 223
: Wasserzeichen/DRM
: PC/MAC/eReader/Tablet
: PDF
This work investigates the energy-level alignment of hybrid inorganic/organic systems (HIOS) comprising ZnO as the major inorganic semiconductor. In addition to offering essential insights, the thesis demonstrates HIOS energy-level alignment tuning within an unprecedented energy range. (Sub)monolayers of organic molecular donors and acceptors are introduced as an interlayer to modify HIOS interface-energy levels. By studying numerous HIOS with varying properties, the author derives generally valid systematic insights into the fundamental processes at work. In addition to molecular pinning levels, he identifies adsorption-induced band bending and gap-state density of states as playing a crucial role in the interlayer-modified energy-level alignment, thus laying the foundation for rationally controlling HIOS interface electronic properties. The thesis also presents quantitative descriptions of many aspects of the processes, opening the door for innovative HIOS interfaces and for future applications of ZnO in electronic devices.
 
Supervisor’s Foreword7
Abstract9
Acknowledgements11
Contents13
Abbreviations16
1 Introduction18
References22
2 Fundamentals24
2.1 Organic Semiconductors: --Conjugated Molecules24
2.2 Electronic Structure Theory27
2.2.1 Nearly Free Electrons28
2.2.2 Model of Tight Binding/LCAO29
2.2.3 The Density of States33
2.2.4 Gap States34
2.3 Models and Processes of Energy--Level Alignment38
2.3.1 Doping and Fermi--Level39
2.3.2 Band Bending41
2.3.3 Vacuum Level Alignment49
2.3.4 Fermi--Level Pinning51
2.3.5 Push Back54
2.3.6 Molecular Film Structure56
References58
3 Theory of Experimental Methods63
3.1 Photoelectron Spectroscopy (PES)63
3.1.1 The Three Step Model of Photoemission66
3.1.2 Interpretation and Analysis of Photoemission Data74
3.2 Near Edge X-ray Absorption Fine Structure (NEXAFS)79
3.2.1 Angular Dependence of Molecular NEXAFS Resonances81
3.3 Scanning Tunneling Microscopy (STM)85
3.4 Low Energy Electron Diffraction (LEED)87
References89
4 Methodology and Experimental Setups93
4.1 Materials and Sample Preparation93
4.1.1 ZnO Crystals93
4.1.2 Organic Materials95
4.2 Experimental Equipment and Settings98
4.2.1 PES, NEXAFS and LEED at BESSY II98
4.2.2 PES, STM/AFM and LEED Setup at the HU Berlin100
4.2.3 PES and LEED at Chiba University101
4.2.4 Optical Characterization of HIOS Structures101
4.3 Data Analysis102
4.3.1 Processing Photoemission Data102
4.3.2 Processing NEXAFS Data103
4.3.3 Processing AFM/STM Data104
4.3.4 PES Peak Fitting and Determination of Positions105
References105
5 Results and Discussion107
5.1 Characterization of the ZnO Faces108
5.1.1 Investigation of the Surface Structure109
5.1.2 Electronic Characterization of the Clean ZnO Faces116
5.2 Donor and Acceptor Molecules on ZnO119
5.2.1 Strong Work Function Increases of ZnO Using F4TCNQ120
5.2.2 F6TCNNQ: A Similar, but Not as Volatile, Acceptor as F4TCNQ131
5.2.3 HATCN, an Application Relevant Acceptor for Tuning the Work Function of ZnO135
5.2.4 A Weak Acceptor, Pentacenetetrone, on ZnO143
5.2.5 Donors on ZnO149
5.3 ZnO Gap State Density of States Limits Adsorption Induced Internal Band Bending155
5.4 Universal Energy-Level Alignment of Para-Sexiphenyl on ZnO162
5.5 Adjusting HIOS Energy-Level Alignment168
5.5.1 Energy-Level Adjustment of 6P on ZnO by HATCN Monolayers169
5.5.2 Demonstration of Continuous Energy-Level Adjustment: SP6 on ZnO(0001)173
5.5.3 Efficient Light Emission from Inorganic and Organic Semiconductor Hybrid Structures by Energy-Level Tuning176
References186
6 Conclusion197
Appendix A Mathematica Code for Band Bending in Depletion Approximation201
Appendix B Main Excitation Lines/Satellites204
Appendix C Program Code for Satellite Removal205
Appendix D NEXAFS ``Dark Current''/Offset Related Artifact208
Appendix E Mathematica Code for Band Bending Using Fermi--Dirac Statistics211
Appendix F Additional Experimental Spectra215
F.1 Work Functions of Differently Prepared ZnO215
F.2 STM of Ex Situ Hot Furnace Annealed ZnO216
F.3 XP Spectra of NMA on ZnO(000bar1)216
F.4 Relationship Between GDOS and ZnO Energy--Level Shifts / UV Irradiation218
F.5 Thick--Film NEXAFS of 6P on ZnO219
Curriculum Vitae221