David C. Joy
David C. Joy(2)
2013(1)
1995(1)
Maschinenbau, Fertigungstechnik(1)
Sonstiges(1)
eBook(2)
English(2)
Oxford University Press, UK(1)
Springer-Verlag(1)
1-2 2
1-2 2
Monte Carlo Modeling for Electron Microscopy and Microanalysis Monte Carlo Modeling for Electron Microscopy and Microanalysis
: David C. Joy   
: 9780195358469   
: Oxford University Press, UK   
: eBook   

DRM   
: PC/MAC/eReader/Tablet   
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CHF 146.80     Download
Helium Ion Microscopy Principles and Applications Helium Ion Microscopy Principles and Applications
: David C. Joy   
: 9781461486602   
: Springer-Verlag   
: eBook   

: Wasserzeichen   
: PC/MAC/eReader/Tablet   
PDF   
CHF 48.40     Download